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    Solo autori OAB     La lista e` ordinata per I.F. in senso decrescente.
Documenti in archivio: 6   -   Autore: Ghigo, M
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 29 / 41
  • Percentage OAB_Authors: 70.73%
  • ∑citations: 0
  • ∑I.F.: 0
  • ∑ I.F. / n. publications: 0

5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS

pdf icon   Fused Silica segments: a possible solution for x-ray telescopes with very high angular resolution like Lynx/XRS

Salmaso, B. , Basso, S. , Civitani, M. , Ghigo, M. , Holyszko, J., Spiga, D. , Vecchi, G. , Pareschi, G.

2017, Proceedings of the SPIE, Volume 10399, id. 103990X 13 pp. (2017).

Basso, S. , Civitani, M. , Ghigo, M. , Holyszko, J., Pareschi, G. , Salmaso, B. , Vecchi, G. , Burwitz, V., Pelliciari, C., Hartner, G., Breunig, E., et al.

2017, Proc. SPIE 10399, 1039911 (2017) - DOI: 10.1117/12.2275335

7. TECHNICAL REPORTS

pdf icon   Detecting the mitigation of fused silica roughening after Ion Beam Figuring

Holyszko, J., Salmaso, B. , Ghigo, M. , Arcangeli, L., Passaretti, F., Spiga, D.

2017, INAF/OAB technical report 05/2017
pdf icon   Fused Silica thin segments for X-ray telescopes: status of the process at OAB.

Salmaso, B. , Basso, S. , Civitani, M. , Ghigo, M. , Pariani, G. , Spiga, D. , Vecchi, G. , Arcangeli, L., Ritucci, A., Rossi, M., Pareschi, G. , et al.

2017, INAF/OAB technical report 10/2017
Interferometric measurement campaign of the NEOSTED Primary Mirror

Ghigo, M. , Vecchi, G. , Basso, S.

2017,
pdf icon   Ion Beam Figuring of thin Fused Silica flat wafers

Salmaso, B. , Ghigo, M.

2017, INAF/OAB technical report 11/2017